Attolight will be at the International Symposium for Testing and Failure Analysis (ISTFA) in Pasadena, CA, USA. Come visit us at booth 504!

Learn more about the work we performed on GaN-based high electron mobility transistors and come see our poster «Failure analysis and defect inspection of high electron mobility transistors by high resolution cathodoluminescence » at the poster session on Wednesday, Nov. 8, 2017 from 1:30 PM- 3:30 PM in Exhibit Hall A/B.

Christian Monachon, our Senior Scientist, will be happy to discuss the topic with you.

See you in Pasadena !